Electric-Field-Controlled Interface Exchange Coupling in Cobalt–Chromia Thin Films
نویسندگان
چکیده
منابع مشابه
Ferromagnetism and interlayer exchange coupling in thin metallic films
This thesis is concerned with the ferromagnetic Kondo lattice (s-d, s-f) model for film geometry. The spin-fermion interaction of this model refers to substances in which localized spins interact with mobile charge carriers like in (dilute) magnetic semiconductors, manganites, or rare-earth compounds. The carrier-mediated, indirect interaction between the localized spins comprises the long-rang...
متن کاملElectric field effect on magnetism in metallic ultra-thin films
Recent experimental developments on the electric field effect on magnetism in metallic magnetic materials are reviewed. The change in the electron density at the surface of metallic ultra-thin magnets by the application of an electric field results in modulations of the Curie temperature, magnetic moment, magnetic anisotropy, and domain wall velocity. The study focused on this paper is the elec...
متن کاملElectric field effect in atomically thin carbon films.
We describe monocrystalline graphitic films, which are a few atoms thick but are nonetheless stable under ambient conditions, metallic, and of remarkably high quality. The films are found to be a two-dimensional semimetal with a tiny overlap between valence and conductance bands, and they exhibit a strong ambipolar electric field effect such that electrons and holes in concentrations up to 10(1...
متن کاملElectric-field-controlled antiferromagnetic domains in epitaxial BiFeO3 thin films probed by neutron diffraction
W. Ratcliff II,1,* Zahra Yamani,2 V. Anbusathaiah,3,† T. R. Gao,3 P. A. Kienzle,1 H. Cao,4 and I. Takeuchi3 1NIST Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA 2Canadian Neutron Beam Centre, National Research Council, Chalk River Laboratories, Chalk River, Ontario, Canada K0J 1J0 3Department of Materials Science and Engineering, U...
متن کاملInterface controlled microstructure evolution in nanolayered thin films
Article history: Received 17 March 2016 Received in revised form 21 May 2016 Accepted 22 May 2016 Available online 7 June 2016 X-ray nano-diffraction and transmission electron microscopy were conducted along the thickness of a ~4 μm thick CrN/AlN multilayer with continuously increasing AlN layer thicknesses from ~1 to 15 nm on ~7 nm thick CrN template layers. The experiments reveal coherent gro...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEEE Transactions on Magnetics
سال: 2017
ISSN: 0018-9464,1941-0069
DOI: 10.1109/tmag.2017.2730178